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ZEISS Korea Materials Science Workshop
» ÀÛ¼ºÀÚ : KSMCB |
» ÀÛ¼ºÀÏ : 2017-03-14 |
» Á¶È¸ : 1467 |
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» ÷ºÎÆÄÀÏ : |
÷ºÎÆÄÀÏÀÌ ¾ø½À´Ï´Ù. |
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ZEISS Korea Materials Science Workshop
ZEISS´Â ¿À´Â 4¿ù 13ÀÏ(¸ñ) ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø¿¡¼ Àç·á ¿¬±¸ ¹× ºÐ¼® Àü¹Ý¿¡ ÃÖ»óÀÇ ¼Ö·ç¼ÇÀ» Á¦°øÇÏ°íÀÚ ‘Materials Science Workshop’À» ÁøÇàÇÕ´Ï´Ù. À̹ø ÀÚ¸®¸¦ ÅëÇØ SEM Àåºñ¿¡¼ºÎÅÍ FE-SEM, FIB, X-ray Çö¹Ì°æ±îÁö Àç·á ¿¬±¸¿¡ ÀûÇÕÇÑ ZEISSÀÇ ºÐ¼®±â¼ú¿¡ ´ëÇØ ¾Ë¾Æ°¡½Ç ¼ö ÀÖ´Â ÀÚ¸®°¡ µÇ±â ¹Ù¶ó¸ç ¸¹Àº °ü½É°ú Âü¿© ºÎŹ µå¸³´Ï´Ù.
•ÀϽÃ: 2017³â 4¿ù 13ÀÏ(¸ñ) ¿ÀÈÄ 1½Ã 30ºÐ – 4½Ã 30ºÐ •Àå¼Ò: ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (°æºÏ ±¸¹Ì) •ÁÖÃÖ: ÀÚÀ̽º ÄÚ¸®¾Æ •ÈÄ¿ø: ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (GERI) •ÇÁ·Î±×·¥
Time
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Program
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Speaker
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13:00 – 13:30
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Registration
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13:30 – 14:15
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An Introduction of SEM for Material Science
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Ãֹα⠰úÀå (ZEISS)
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14:15 – 15:00
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ZEISS Crossbeam – Advancing Capabilities in High Throughput 3D Analysis and Nanofabrication
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¹Úº´ÁØ Â÷Àå(ZEISS)
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15:00 – 15:15
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Break
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15:15 – 16:00
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ZEISS X-ray Microscopy: 3D & 4D Imaging for Materials Science
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Mr. Jin Yoon(ZEISS)
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16:00 – 16:30
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GERI FIB Demonstration Tour
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±èÁö¼ö ¿¬±¸¿ø(GERI)
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•Âü°¡½Åû : ½Åû ÆäÀÌÁö ³» ¾ç½Ä ä¿î µÚ Á¦Ãâ https://www.zeiss.co.kr/microscopy/local-content/news-and-events/2017/materials-science-workshop.html •¹®ÀÇ : ÀÚÀ̽º ÄÚ¸®¾Æ Çö¹Ì°æ »ç¾÷ºÎ °È¿¸² ´ë¸® (E-mail : hyolim.kang@zeiss.com / Tel : 02-3140-2729) •±âŸ ¾È³» : °ÀÇ ÇÁ·Î±×·¥Àº ¸ðµÎ ¹«·á·Î Á¦°øµÇ¸ç, ÁÖÂ÷ °ø°£Àº ¹«·á·Î »ç¿ëÇÏ½Ç ¼ö ÀÖ½À´Ï´Ù.
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